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Thermal Properties of Ultrathin Hafnium Oxide Gate Dielectric Films

✍ Scribed by Panzer, M.A. ;Shandalov, M. ;Rowlette, J.A. ;Oshima, Y. ;Yi Wei Chen, ;McIntyre, P.C. ;Goodson, K.E.

No coin nor oath required. For personal study only.

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