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The effects of fixed bulk charge on the thermal noise in metal-oxide-semiconductor transistors

✍ Scribed by Sah, C.T.; Wu, S.Y.; Hielscher, F.H.


Book ID
114588982
Publisher
IEEE
Year
1966
Tongue
English
Weight
544 KB
Volume
ED-13
Category
Article
ISSN
0018-9383

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