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The effects of fixed bulk charge on the characteristics of metal-oxide-semiconductor transistors : C. T. Sah and H. C. Pao, IEEE Trans. Electron Devices, Vol. 13, No. 4, April (1966), p. 393

Publisher: Elsevier Science
Year: 1967
Tongue: English
Weight: 103 KB
Volume: 6
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(67)90056-x

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