The effects of fixed bulk charge on the thermal noise in metal-oxide-seminconductor transistors : C. T. Sah, S. Y. Wu and F. H. Hielscher, IEEE Trans. Electron Devices. Vol. 13, No. 4, April (1966), p. 410

• Publisher: Elsevier Science
• Year: 1967
• Tongue: English
• Weight: 103 KB
• Volume: 6
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(67)90057-1