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Low-frequency noise in deep-submicron metal-oxide-semiconductor field-effect transistors

✍ Scribed by Celik-Butler, Z.

Book ID: 114447852
Publisher: The Institution of Electrical Engineers
Year: 2002
Tongue: English
Weight: 936 KB
Volume: 149
Category: Article
ISSN: 1350-2409
DOI: 10.1049/ip-cds:20020332

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