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Low frequency noise in SiGe-base heterojunction bipolar transistors and SiGe-channel metal oxide semiconductor field effect transistors

✍ Scribed by J.A Chroboczek; G Ghibaudo


Book ID
108361754
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
288 KB
Volume
40
Category
Article
ISSN
0026-2714

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Effect of Ge content and profile in the
✍ Mukul K. Das; N. R. Das; P. K. Basu πŸ“‚ Article πŸ“… 2005 πŸ› John Wiley and Sons 🌐 English βš– 217 KB

In this paper, the effects of Ge content and profile shape on the performance of a SiGe-based heterojunction bipolar transistor (HBT) are investigated. The common-emitter current gain, the early voltage, and the transit time of SiGe HBTs are calculated and computed for different Ge profiles as well