✦ LIBER ✦
A comparison of early stage hot carrier degradation behaviour in 5 and 3 V sub-micron low doped drain metal oxide semiconductor field effect transistors
✍ Scribed by M.M. De Souza; J. Wang; S. Manhas; E.M. Sankara Narayanan; A.S. Oates
- Book ID
- 108361796
- Publisher
- Elsevier Science
- Year
- 2001
- Tongue
- English
- Weight
- 539 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0026-2714
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