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Simple technique for separating the effects of interface traps and trapped-oxide charge in metal-oxide-semiconductor transistors

✍ Scribed by McWhorter, P. J.; Winokur, P. S.


Book ID
120029334
Publisher
American Institute of Physics
Year
1986
Tongue
English
Weight
476 KB
Volume
48
Category
Article
ISSN
0003-6951

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