✦ LIBER ✦
Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm
✍ Scribed by Chim, W. K.; Leang, S. E.; Chan, D. S. H.
- Book ID
- 120484104
- Publisher
- American Institute of Physics
- Year
- 1997
- Tongue
- English
- Weight
- 491 KB
- Volume
- 81
- Category
- Article
- ISSN
- 0021-8979
- DOI
- 10.1063/1.364055
No coin nor oath required. For personal study only.