Implicit Continuous Current–Voltage Model for Surrounding-Gate Metal–Oxide–Semiconductor Field-Effect Transistors Including Interface Traps

✍ Scribed by Yun Seop Yu; Namki Cho; Sung Woo Hwang; Doyeol Ahn

• Book ID: 114620550
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 515 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2156412