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The drain velocity overshoot in an 80 nm metal-oxide-semiconductor field-effect transistor

✍ Scribed by Tan, Michael L. P.; Arora, Vijay K.; Saad, Ismail; Taghi Ahmadi, Mohammad; Ismail, Razali

Book ID: 121832488
Publisher: American Institute of Physics
Year: 2009
Tongue: English
Weight: 440 KB
Volume: 105
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.3091278

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