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An analytic theory of the impact of velocity overshoot on the drain characteristics of field-effect transistors

✍ Scribed by Blakey, P.A.; Joardar, K.

Book ID: 114534534
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 336 KB
Volume: 39
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.123505

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