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Effect of deep-level impurities on the drain characteristics of short-channel metal-semiconductor field effect transistors

✍ Scribed by Chattopadhyay, P; Majumdar, L

Book ID: 111657762
Publisher: Institute of Physics
Year: 1998
Tongue: English
Weight: 135 KB
Volume: 13
Category: Article
ISSN: 0268-1242
DOI: 10.1088/0268-1242/13/2/012

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