✦ LIBER ✦

Test compaction for sequential circuits

✍ Scribed by Niermann, T.M.; Roy, R.K.; Patel, J.H.; Abraham, J.A.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Procedures for static compaction of test

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 350 KB

Reverse-order-restoration-based static t

✍ Ruifeng Guo; Reddy, S.M.; Pomeranz, I. 📂 Article 📅 2003 🏛 IEEE 🌐 English ⚖ 816 KB

Static test compaction for synchronous s

✍ Pomeranz, I.; Reddy, S.M.; Guo, R. 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 242 KB

Vector replacement to improve static-tes

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 191 KB

Test Set and Fault Partitioning Techniqu

✍ Michael S. Hsiao; Srimat Chakradhar 📂 Article 📅 2000 🏛 Springer US 🌐 English ⚖ 74 KB

Fast static compaction algorithms for se

✍ Hsiao, M.S.; Rudnick, E.M.; Patel, J.H. 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 478 KB