๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Static test compaction for synchronous sequential circuits based on vector restoration

โœ Scribed by Pomeranz, I.; Reddy, S.M.; Guo, R.


Book ID
119778490
Publisher
IEEE
Year
1999
Tongue
English
Weight
242 KB
Volume
18
Category
Article
ISSN
0278-0070

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES