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Reverse-order-restoration-based static test compaction for synchronous sequential circuits

✍ Scribed by Ruifeng Guo; Reddy, S.M.; Pomeranz, I.

Book ID: 118698346
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 816 KB
Volume: 22
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2002.807885

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