๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Test Set and Fault Partitioning Techniques for Static Test Sequence Compaction for Sequential Circuits

โœ Scribed by Michael S. Hsiao; Srimat Chakradhar

Book ID
110261840
Publisher
Springer US
Year
2000
Tongue
English
Weight
74 KB
Volume
16
Category
Article
ISSN
0923-8174

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Static test compaction for IDDQ testing
Static test compaction for IDDQ testing of bridging faults in sequential circuits
โœ Yoshinobu Higami; Kewal K. Saluja; Yuzo Takamatsu; Kozo Kinoshita ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 335 KB ๐Ÿ‘ 2 views

This paper presents a static test compaction method for IDDQ testing of sequential circuits. Test compaction reduces test application time and tester memory and consequently reduces testing cost. Particularly for IDDQ testing, measurement of IDDQ is time-consuming, and thus test compaction is a very

Test sequence compaction methods for acy
Test sequence compaction methods for acyclic sequential circuits using a time expansion model
โœ Toshinori Hosokawa; Tomoo Inoue; Toshihiro Hiraoka; Hideo Fujiwara ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 181 KB

## Abstract Test sequences for acyclic sequential circuits can be generated by using a time expansion model. In this paper, static and dynamic test sequence compaction techniques are proposed in which the test sequence generated by the time expansion model has two characteristics: (1) The test sequ