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Static test compaction for diagnostic test sets of full-scan circuits

✍ Scribed by Pomeranz, I.; Reddy, S.M.

Book ID: 117809907
Publisher: The Institution of Engineering and Technology
Year: 2010
Tongue: English
Weight: 172 KB
Volume: 4
Category: Article
ISSN: 1751-8601
DOI: 10.1049/iet-cdt.2009.0110

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