✦ LIBER ✦
Transparent scan: a new approach to test generation and test compaction for scan circuits that incorporates limited scan operations
✍ Scribed by Pomeranz, I.; Reddy, S.M.
- Book ID
- 118698456
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 485 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0278-0070
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