Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation

✍ Scribed by El-Maleh, A.H.; Khursheed, S.S.; Sait, S.M.

• Book ID: 118698499
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 398 KB
• Volume: 25
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2006.873895