Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults

✍ Scribed by Jaehoon Song; Juhee Han; Hyunbean Yi; Taejin Jung; Sungju Park

• Book ID: 115510278
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 2009
• Tongue: English
• Weight: 385 KB
• Volume: 56
• Category: Article
• ISSN: 1549-7747
• DOI: 10.1109/tcsii.2009.2022373