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Efficient Interconnect Test Patterns for Crosstalk and Static Faults

✍ Scribed by Pyoungwoo Min; Hyunbean Yi; Jaehoon Song; Sanghyeon Baeg; Sungju Park

Book ID: 117907672
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 411 KB
Volume: 25
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2006.873899

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