✦ LIBER ✦

Test pattern generation for crosstalk faults considering the gate delay

✍ Scribed by Noriyoshi Itazaki; Kozo Kinoshita; Hisao Naitoh

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

On the modelling of digital circuits for

✍ Stavros P. Dokouzyannis 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 518 KB

On the Use of ZBDDs for Implicit and Com

✍ Kyriakos Christou; Maria K. Michael; Spyros Tragoudas 📂 Article 📅 2008 🏛 Springer US 🌐 English ⚖ 579 KB