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Vector replacement to improve static-test compaction for synchronous sequential circuits

✍ Scribed by Pomeranz, I.; Reddy, S.M.

Book ID: 119778749
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 191 KB
Volume: 20
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.908476

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