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Fast static compaction algorithms for sequential circuit test vectors

✍ Scribed by Hsiao, M.S.; Rudnick, E.M.; Patel, J.H.

Book ID: 119772964
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 478 KB
Volume: 48
Category: Article
ISSN: 0018-9340
DOI: 10.1109/12.754997

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