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Procedures for static compaction of test sequences for synchronous sequential circuits

โœ Scribed by Pomeranz, I.; Reddy, S.M.


Book ID
119773114
Publisher
IEEE
Year
2000
Tongue
English
Weight
350 KB
Volume
49
Category
Article
ISSN
0018-9340

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Test compaction for sequential circuits
โœ Niermann, T.M.; Roy, R.K.; Patel, J.H.; Abraham, J.A. ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› IEEE ๐ŸŒ English โš– 766 KB