✦ LIBER ✦

A diagnostic test generation procedure based on test elimination by vector omission for synchronous sequential circuits

✍ Scribed by Pomeranz, I.; Reddy, S.M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

On the Use of Functional Test Generation

✍ Irith Pomeranz; Sudhakar M. Reddy 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 223 KB

Static test compaction for synchronous s

✍ Pomeranz, I.; Reddy, S.M.; Guo, R. 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 242 KB

PROPTEST: a property-based test generato

✍ Ruifeng Guo; Reddy, S.M.; Pomeranz, I. 📂 Article 📅 2003 🏛 IEEE 🌐 English ⚖ 584 KB

3-weight pseudo-random test generation b

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 1993 🏛 IEEE 🌐 English ⚖ 935 KB

A sequential elimination procedure for c

✍ P. Bauer 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 494 KB

Built-in test sequence generation for sy

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 372 KB