✦ LIBER ✦
Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of input sequences using single and multiple fault detection times
✍ Scribed by Pomeranz, I.; Reddy, S.M.
- Book ID
- 119773337
- Publisher
- IEEE
- Year
- 2002
- Tongue
- English
- Weight
- 372 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0018-9340
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