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3-weight pseudo-random test generation based on a deterministic test set for combinational and sequential circuits

✍ Scribed by Pomeranz, I.; Reddy, S.M.

Book ID: 119777687
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 935 KB
Volume: 12
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.238041

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