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[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - A new SAT-based ATPG for generating highly compacted test sets

✍ Scribed by Eggersglu, Stephan; Krenz-Baath, Rene; Glowatz, Andreas; Hapke, Friedrich; Drechsler, Rolf

Book ID: 118186303
Publisher: IEEE
Year: 2012
Weight: 147 KB
Category: Article
ISBN: 1467311863
DOI: 10.1109/ddecs.2012.6219063

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