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[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Characterization of digital cells for statistical test

✍ Scribed by Hopsch, Fabian; Lindig, Michael; Straube, Bernd; Vermeiren, Wolfgang

Book ID: 118039038
Publisher: IEEE
Year: 2011
Weight: 958 KB
Volume: 0
Category: Article
ISBN: 1424497558
DOI: 10.1109/ddecs.2011.5783089

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