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[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Proof certificates and non-linear arithmetic constraints

✍ Scribed by Kupferschmid, S.; Becker, B.; Teige, T.; Franzle, M.

Book ID: 118116334
Publisher: IEEE
Year: 2011
Weight: 586 KB
Volume: 0
Category: Article
ISBN: 1424497558
DOI: 10.1109/ddecs.2011.5783131

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