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[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - LC-VCO design automation tool for nanometer CMOS technology

✍ Scribed by Siwiec, Krzysztof; Borejko, Tomasz; Pleskacz, Witold A.

Book ID: 117991025
Publisher: IEEE
Year: 2012
Weight: 987 KB
Category: Article
ISBN: 1467311863
DOI: 10.1109/ddecs.2012.6219027

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