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[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Efficient link-level error resilience in 3D NoCs

โœ Scribed by Pasca, Vladimir; Rehman, Saif-Ur; Anghel, Lorena; Benabdenbi, Mounir


Book ID
115525579
Publisher
IEEE
Year
2012
Weight
793 KB
Category
Article
ISBN
1467311863

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