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A storage-based built-in test pattern generation method for scan circuits based on partitioning and reduction of a precomputed test set

✍ Scribed by Pomeranz, I.; Reddy, S.M.

Book ID: 118697639
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 397 KB
Volume: 51
Category: Article
ISSN: 0018-9340
DOI: 10.1109/tc.2002.1047753

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