✦ LIBER ✦

Technique for preparing cross-section transmission electron microscope specimens from ion-irradiated ceramics

✍ Scribed by Zinkle, S. J. ;Haltom, C. P. ;Jenkins, L. C. ;DuBose, C. K. H.

Publisher: Wiley (John Wiley & Sons)
Year: 1991
Tongue: English
Weight: 917 KB
Volume: 19
Category: Article
ISSN: 0741-0581
DOI: 10.1002/jemt.1060190407

No coin nor oath required. For personal study only.

✦ Synopsis

Abstract

The general techniques necessary to produce a high‐quality cross‐sectioned ceramic specimen for transmission electron microscope observation are outlined. A particularly important point is that the width of the glued region between faces of the ceramic specimen must be < 0.2 μm to prevent loss of the near‐surface region during ion milling. A recently developed vise for gluing ceramic cross‐section specimens is described, and some examples of the effect of glue thickness on specimen quality are shown.

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