## Abstract A method is described for the preparation of crossβsectional samples of thin films for transmission electron microscopy. The technique produces larger amounts of thin region as compared with ion milling and eliminates the problems associated with ion beam damage. The requirement is that
The preparation of cross-sectional specimens of thin poorly adhered scales for transmission electron microscopy
β Scribed by P. Fox
- Publisher
- John Wiley and Sons
- Year
- 1992
- Tongue
- English
- Weight
- 250 KB
- Volume
- 21
- Category
- Article
- ISSN
- 1059-910X
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β¦ Synopsis
INTRODUCTION.
The high temperature oxidation of alumina-and chromia-forming metals and alloys has been studied for many years. Although it is fairly easy to produce TEM cross-sections of the adherent scales formed on alloys containing reactive elements it has proved more difficult to cross-section the less adherent scales. In this paper a technique which has been used to produce cross-sections of these poorly adhered scales will be described.
The technique has similarities to those used by other workers to produce TEM cross-sections (Abrahm
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