✦ LIBER ✦

Preparation of cross-sectional specimens of ceramic thermal barrier coatings for transmission electron microscopy

✍ Scribed by Unal, O. ;Heuer, A. H. ;Mitchell, T. E.

Publisher: Wiley (John Wiley & Sons)
Year: 1990
Tongue: English
Weight: 626 KB
Volume: 14
Category: Article
ISSN: 0741-0581
DOI: 10.1002/jemt.1060140404

No coin nor oath required. For personal study only.

✦ Synopsis

During the microstructural examination of ceramic thermal barrier coatings by transmission electron microscopy (TEM), initial efforts for the preparation of cross-sectional thin foils from interface regions by conventional means were mostly failures. Delamination of the Yz03-stabilized ZrOz ceramic coating from the nickel-base alloy substrate sometimes occurred during fine polishing a t around 80 km thickness but mostly occurred during dimpling. Because of this sensitivity, special techniques for mechanical handling were developed so that ion milling could give thin enough regions of the metal-ceramic interface. TEM showed convincingly that the highly fragile nature of the coatings is in fact due to the extensive porosity at the interface developed as a result of heat treatment.

📜 SIMILAR VOLUMES

The preparation of cross-sectional speci

The preparation of cross-sectional specimens of thin poorly adhered scales for transmission electron microscopy

✍ P. Fox 📂 Article 📅 1992 🏛 John Wiley and Sons 🌐 English ⚖ 250 KB 👁 1 views

## INTRODUCTION. The high temperature oxidation of alumina-and chromia-forming metals and alloys has been studied for many years. Although it is fairly easy to produce TEM cross-sections of the adherent scales formed on alloys containing reactive elements it has proved more difficult to cross-sect

Technique for preparing cross-section tr

Technique for preparing cross-section transmission electron microscope specimens from ion-irradiated ceramics

✍ Zinkle, S. J. ;Haltom, C. P. ;Jenkins, L. C. ;DuBose, C. K. H. 📂 Article 📅 1991 🏛 Wiley (John Wiley & Sons) 🌐 English ⚖ 917 KB

## Abstract The general techniques necessary to produce a high‐quality cross‐sectioned ceramic specimen for transmission electron microscope observation are outlined. A particularly important point is that the width of the glued region between faces of the ceramic specimen must be < 0.2 μm to preve

Preparation of lithium specimens for tra

Preparation of lithium specimens for transmission electron microscopy

✍ Liu, Dang-Rong ;Rommal, H. E. George ;Williams, David B. 📂 Article 📅 1986 🏛 Wiley (John Wiley & Sons) 🌐 English ⚖ 378 KB

A method of preparing undeformed thin lithium specimens for TEM is described. A solution of dehydrated methanol and toluene is used both for initial dishing of the foil by chemical polishing and also for final thinning. Under electron beam irradiation in the TEM, new pure Li crystals can grow out of

Sample preparation technique for cross-s

Sample preparation technique for cross-sectional transmission electron microscopy of quantum wire structures

✍ Yu-Pei Chen; Jason D. Reed; Sean S. O'Keefe; William J. Schaff; Lester F. Eastma 📂 Article 📅 1993 🏛 John Wiley and Sons 🌐 English ⚖ 363 KB 👁 1 views

A novel cross-sectional sample preparation technique for quantum wire (QWR) structures is described. By coating a thin layer of Au with a designed pattern on the sample as a marker to indicate the position of the wire pattern, the location of the thinned area can be controlled precisely. An example

The preparation of cross-sectional trans

The preparation of cross-sectional transmission electron microscopy specimens of Nb/Al multilayer thin films on sapphire substrates

✍ Barmak, Katayun ;Rudman, David A. ;Foner, Simon 📂 Article 📅 1990 🏛 Wiley (John Wiley & Sons) 🌐 English ⚖ 607 KB

## Abstract We have developed a technique for preparation of cross‐sectional transmission electron microscopy samples of reacted and unreacted Nb/al multilayer thin films on sapphire substrates. The choice of substrate was found to be extremely important. Sapphire sputters more slowly than Nb and N

A novel technique for the preparation of

A novel technique for the preparation of thin films for cross-sectional transmission electron microscopy

✍ Heuer, J. P. ;Howitt, D. G. 📂 Article 📅 1990 🏛 Wiley (John Wiley & Sons) 🌐 English ⚖ 256 KB 👁 1 views

## Abstract A method is described for the preparation of cross‐sectional samples of thin films for transmission electron microscopy. The technique produces larger amounts of thin region as compared with ion milling and eliminates the problems associated with ion beam damage. The requirement is that