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Controlled-Depth and cross-section preparation techniques for transmission electron microscopy subsurface studies in metals

✍ Scribed by A. Garcia-Borquez; W. Kesternich

Publisher: John Wiley and Sons
Year: 1993
Tongue: English
Weight: 854 KB
Volume: 25
Category: Article
ISSN: 1059-910X
DOI: 10.1002/jemt.1070250307

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✦ Synopsis

Thin film specimen preparation from bulk material a t a controlled depth below the surface and cross-section thin film preparation for transmission electron microscope investigations of electrically conducting materials are described. Both techniques are illustrated by austenitic stainless steel, where they have been used complementary to each other for microstructural studies of subsurface ion irradiation damage. The advantages and limitations of both techniques are discussed. o 1993 Wiley-Liss, Inc.

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