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Take-off angle-dependent X-ray fluorescence of thin films at glancing incidence

✍ Scribed by Kouichi Tsuji; Kichinosuke Hirokawa

Book ID
113374950
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
813 KB
Volume
48
Category
Article
ISSN
0584-8547

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✍ Tsuji, Kouichi; Hirokawa, Kichinosuke 📂 Article 📅 1996 🏛 John Wiley and Sons 🌐 English ⚖ 945 KB

We have measured Au and Ni thin films on a quartz glass using both scanning tunnelling microscopy (STM) and glancing-incidence and -take-off x-ray fluorescence (GIT-XRF). The STM image shows that the film surface consists of grains of several tens of nanometres in size. Although the GIT-XRF method u