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Development of glancing-incidence and glancing-take-off X-ray fluorescence apparatus for surface and thin-film analyses

โœ Scribed by Kouichi Tsuji; Kazuaki Wagatsuma; Kichinosuke Hirokawa; Takashi Yamada; Tadashi Utaka

Book ID
114254494
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
301 KB
Volume
52
Category
Article
ISSN
0584-8547

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Glancing-Incidence and -Take-off X-ray F
Glancing-Incidence and -Take-off X-ray Fluorescence and Scanning Tunnelling Microscopy of Thin Films Under X-ray Irradiation
โœ Tsuji, Kouichi; Hirokawa, Kichinosuke ๐Ÿ“‚ Article ๐Ÿ“… 1996 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 945 KB

We have measured Au and Ni thin films on a quartz glass using both scanning tunnelling microscopy (STM) and glancing-incidence and -take-off x-ray fluorescence (GIT-XRF). The STM image shows that the film surface consists of grains of several tens of nanometres in size. Although the GIT-XRF method u