A thermally stable Ni-based ohmic contact is one of the most attractive contact materials for developing superior GaAs devices. To understand the interface reaction between an Ni thin film and a GaAs wafer, a combined grazing-incidence and grazing-takeoff x-ray fluorescence (GIT-XRF) method was appl
Development and application of glancing incident X-ray fluorescence spectrometry using parallel polycapillary X-ray lens
โ Scribed by Jun Yang; Dandan Zhao; Qing Xu; Xunliang Ding
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 312 KB
- Volume
- 255
- Category
- Article
- ISSN
- 0169-4332
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