There are important technological and scientific needs for accurate and precise measurements of the weight and thickness of silicone coatings, which are used in wide-ranging applications. X-ray fluorescence (XRF) spectroscopy offers one means of achieving such measurements. Here we show that, as pre
Development and application of multi-purpose x-ray fluorescence analyzer using synchrotron and conventional x-ray sources
โ Scribed by Yasuko Terada; Nahoko Kondo; Masaki Kataoka; Masaki Izumiyama; Izumi Nakai; Shunji Goto
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 55 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0049-8246
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โฆ Synopsis
A multi-purpose analyzer was developed to carry out x-ray fluorescence (XRF) analysis of micro-samples and total reflection x-ray fluorescence (TXRF) analysis of environmental samples using either conventional x-ray or synchrotron radiation as an excitation source. Cosmic dust samples collected in Antarctica were successfully analyzed using a conventional x-ray source. XRF spectra of 36 cosmic dust samples were measured automatically using a combination of specially designed software and a sample holder, and trace amounts of heavy elements (10 ppm level in the sample) were detected. The potential ability of the XRF analyzer in TXRF mode using synchrotron x-rays from a third-generation light source, SPring-8, was tested using a standard river water and arsenic-containing water as samples. Satisfactory linearity of concentration versus net intensity of As was obtained in the concentration range 100 fg-100 ng with a detection limit of 10 fg.
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