Glancing-Incidence and -Take-off X-ray Fluorescence and Scanning Tunnelling Microscopy of Thin Films Under X-ray Irradiation

✍ Scribed by Tsuji, Kouichi; Hirokawa, Kichinosuke

• Publisher: John Wiley and Sons
• Year: 1996
• Tongue: English
• Weight: 945 KB
• Volume: 24
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/(sici)1096-9918(199604)24:4<286::aid-sia109>3.0.co;2-w

✦ Synopsis

We have measured Au and Ni thin films on a quartz glass using both scanning tunnelling microscopy (STM) and glancing-incidence and -take-off x-ray fluorescence (GIT-XRF). The STM image shows that the film surface consists of grains of several tens of nanometres in size. Although the GIT-XRF method utilizes a total reflection phenomenon which occurs on a flat surface, a surface roughness of 10 nm does not affect the GIT-XRF analysis. Moreover, we demonstrate for the first time that STM observation is possible under x-ray irradiation.