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Structure of Glancing Incidence Deposited TiO2 Thin Films as Revealed by Grazing Incidence Small-Angle X-ray Scattering

✍ Scribed by Lola González-García; Angel Barranco; Adela Muñoz Páez; Agustín R. González-Elipe; Mari-Cruz García-Gutiérrez; Jaime J. Hernández; Daniel R. Rueda; Tiberio A. Ezquerra; David Babonneau

Publisher: John Wiley and Sons
Year: 2010
Tongue: English
Weight: 356 KB
Volume: 11
Category: Article
ISSN: 1439-4235
DOI: 10.1002/cphc.201000136

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Characterization of in-plane structures

Characterization of in-plane structures of vapor deposited thin-films of distyryl-oligothiophenes by grazing incidence x-ray diffractometry

✍ Noriyuki Yoshimoto; Keijyu Aosawa; Toshinori Taniswa; Kazuhiko Omote; J. Ackerma 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 518 KB

## Abstract The in‐plane structures of vapor deposited ultrathin films of distyryl‐oligothiophenes (DS‐2T) on SiO~2~ substrate were characterized by grazing incidence x‐ray diffractometry (GIXD). Two polymorphs, low‐temperature and high‐temperature phases, were identified, and the two dimensional u