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Preparation and characterization of Bi2S3-PbS thin films by X-ray diffraction, scanning electron microscopy and resistivity studies

✍ Scribed by Nilima Parhi; B.B. Nayak; B.S. Acharya

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 658 KB
Volume: 254
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(94)06266-n

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