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Formation and characterization of thin film vanadium oxides: Auger electron spectroscopy, X-ray photoelectron spectroscopy, X-ray diffraction, scanning electron microscopy, and optical reflectance studies

✍ Scribed by A.Z. Moshfegh; A. Ignatiev

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 938 KB
Volume: 198
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(91)90344-w

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