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Characterization of thin zinc-rich and oxygen-rich zinc oxide layers by thermolysis, photolysis, scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS)

✍ Scribed by M. Grunze; W. Hirschwald; E. Thull


Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
29 KB
Volume
34
Category
Article
ISSN
0040-6090

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