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Scanning tunneling microscopy and X-ray reflectometry of Pt and Pd thin films prepared by DC sputtering

✍ Scribed by O. Enea; M. Rafai; A. Naudon

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
861 KB
Volume
42-44
Category
Article
ISSN
0304-3991

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