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Takeoff angle‐dependent x‐ray fluorescence of layered materials using a glancing incident x‐ray beam

✍ Scribed by Tsuji, Kouichi; Hirokawa, Kichinosuke

Book ID
118063199
Publisher
American Institute of Physics
Year
1994
Tongue
English
Weight
900 KB
Volume
75
Category
Article
ISSN
0021-8979

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✍ Kouichi Tsuji; Kazuaki Wagatsuma; Takeo Oku 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 127 KB 👁 1 views

A thermally stable Ni-based ohmic contact is one of the most attractive contact materials for developing superior GaAs devices. To understand the interface reaction between an Ni thin film and a GaAs wafer, a combined grazing-incidence and grazing-takeoff x-ray fluorescence (GIT-XRF) method was appl